State-space analysis and identification for a class of hysteretic systems.

Observation of zero creep in piezoelectric actuators

Characterization and control of piezo driven scanning probe translation mechanisms

Characterisation and control of piezo driven scanning probe translation mechanisms

Electro-optic transfer function measurements using an ultra fast ellipsometer.

Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster.

Design and construction of a high resolution 3D translation stage for metrological applications

Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes

Control considerations for a Scanning Tunneling Microscope