State-space analysis and identification for a class of hysteretic systems.

Observation of zero creep in piezoelectric actuators

Design and construction of a high resolution 3D translation stage for metrological applications

Electro-optic transfer function measurements using an ultra fast ellipsometer.

Characterisation and control of piezo driven scanning probe translation mechanisms

Characterization and control of piezo driven scanning probe translation mechanisms

Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster.

Sub-Angstrom resolution position feedback and control in Scanning Probe Microscopes

Control considerations for a Scanning Tunneling Microscope