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A Beyer
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2 records found
Ultrahigh resolution focused electron beam induces processing: the effect of substrate thickness
Journal article -
W.F. van Dorp
,
I. Lazic
,
A Beyer
,
A Golzhauser
,
JB Wagner
,
TW Hansen
,
C.W. Hagen
Focused electron beam induced processing and the effect of substrate thickness revisited
Journal article -
W.F. van Dorp
,
A Beyer
,
M Mainka
,
A Gölzhäuser
,
TW Hansen
,
JB Wagner
,
C.W. Hagen
,
JTM de Hosson