6 records found
1
Design dependent SRAM PUF robustness analysis
Intelligent voltage ramp-up time adaptation for temperature noise reduction on memory-based PUF systems
Testing PUF-based secure key storage circuits
Testing methods for PUF-based secure key storage circuits
Adapting voltage ramp-up time for temperature noise reduction on memory-based PUFs
Modeling SRAM Start-Up Behavior for Physical Unclonable Functions
