Recently, Memristor (MR) device has received much attention in many applications, including memory, computing, neuromorphic, sensing, and security. Electrical characterization and testing of MR are among the main challenges facing MR technology. Available MR characterization tools are costly and bulky, limiting the research contributions in this field to big institutions. Furthermore, there is a need for a portable testing platform that provides the means to extract MR parameters, mainly when used in sensing or security applications. This work proposes a novel power-efficient, cost-effective, lightweight, and automated Arduino-based MR characterization platform named MemChar. A detailed circuit and system implementation of MemChar are presented. MemChar functionality results are compared to industry-standard device parameter analyzer tools, i.e., Keithley 4200A, with excellent correlation. MemChar is an easy-to-implement and user-friendly platform that provides a significant milestone toward utilizing MR devices in mobile, IoT, and sensing applications.

This study presents a novel hybrid memristor (MR)-complementary metal-oxide-semiconductor-based flash analogue-to-digital converter (ADC). The speed and efficiency of the ADC are important aspects that can significantly affect the overall system performance. The flash ADC is considered the fastest type of ADCs; however, its performance is affected by the resistor mismatch. The proposed flash ADC is the first to use tunable MR to replace conventional resistor to generate accurate reference voltages. This is achieved by utilising the highly analogue behaviour observed in multi-state MR devices fabricated and tested by the authors' group. The electrical parameters of the devices have been extracted by device characterisation, then the voltage-threshold adaptive model (VTEAM) has been used to develop a correlated mathematical and Simulation Program with Integrated Circuit Emphasis (SPICE) device model. The proposed MR-based flash-ADC design solves the issue of resistor mismatch that results in encoding errors by the ability to tune the MR resistance value post-processing. Moreover, being a nanoscale component, the usage of MR significantly improves the area efficiency of the target ADC. Furthermore, the proposed design has improved the ADC transfer function characteristic and has lower differential non-linearity and integral non-linearity errors compared with the conventional design.