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W Hoekstra
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Leakage current modeling of test structures for characterization of dark current in CMOS image sensors
Journal article -
NV Loukianova
,
H-O Folkerts
,
JPV Maas
,
DWE Verbugt
,
AJ Mierop
,
W Hoekstra
,
E Roks
,
A.J.P.A.M. Theuwissen