YA
Yash Audichya
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Protection Testing for Multiterminal High-Voltage dc Grid
Procedures and Assessment
Journal article
(2020)
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Zhou Liu, Seyed Sattar Mirhosseini, Marjan Popov, Yash Audichya, Daniele Colangelo, Sadegh Jamali, Peter Palensky, Weihao Hu, Zhe Chen
eAssessment The application of multiterminal (MT), high-voltage dc (HVdc) (MTdc) grid technology requires test procedures for the operation and implementation of the protection solutions. The test procedures are usually derived from experience and from extensive measurement data, which, at present, are still not widely available. Based on a hardware-inthe- loop (HIL) method, advanced dc protection testing strategies, utilizing existing experience for ac grids and requirements for MTdc grids, may overcome this gap.
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eAssessment The application of multiterminal (MT), high-voltage dc (HVdc) (MTdc) grid technology requires test procedures for the operation and implementation of the protection solutions. The test procedures are usually derived from experience and from extensive measurement data, which, at present, are still not widely available. Based on a hardware-inthe- loop (HIL) method, advanced dc protection testing strategies, utilizing existing experience for ac grids and requirements for MTdc grids, may overcome this gap.