Determining the material structure of microcrystalline silicon from Raman spectra
Journal Article
(2003)
Author(s)
C Smit (TU Delft - Electronic Components, Technology and Materials)
René A.C.M.M. Swaaij (TU Delft - Electronic Components, Technology and Materials)
H Donker (TU Delft - Old - sect Laboratory Inorganic Chemistry (DCT/AC))
AMHN Petit (TU Delft - Electronic Components, Technology and Materials)
W. M.M. Kessels (External organisation)
MCM van de Sanden (External organisation)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:0031e734-32d3-47dc-a9b2-b4de2403a2b0
More Info
expand_more
expand_more
Publication Year
2003
Research Group
Electronic Components, Technology and Materials
Issue number
5
Volume number
94
Pages (from-to)
3582-3588
No files available
Metadata only record. There are no files for this record.