Determining the material structure of microcrystalline silicon from Raman spectra

Journal article (2003)

Authors

C Smit Electronic Components, Technology and Materials -

R.A.C.M.M. van Swaaij Electronic Components, Technology and Materials -

H Donker Old - sect Laboratory Inorganic Chemistry (DCT/AC)

AMHN Petit Electronic Components, Technology and Materials -

WMM Kessels External organisation

MCM van de Sanden External organisation

Research Group

Electronic Components, Technology and Materials () (TU Delft)

Elektrotechniek Techniek

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http://resolver.tudelft.nl/uuid:0031e734-32d3-47dc-a9b2-b4de2403a2b0

Published Date

2003

Language

Undefined/Unknown

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials