Determining the material structure of microcrystalline silicon from Raman spectra

Smit, C; van Swaaij, Rene; Donker, H; Petit, AMHN; Kessels, WMM; van de Sanden, MCM

Determining the material structure of microcrystalline silicon from Raman spectra

Journal article (2003)

Authors

C Smit Electronic Components, Technology and Materials

Rene van Swaaij Electronic Components, Technology and Materials

H Donker Old - sect Laboratory Inorganic Chemistry (DCT/AC)

AMHN Petit Electronic Components, Technology and Materials

WMM Kessels External organisation

MCM van de Sanden External organisation

Research Group

Electronic Components, Technology and Materials

Elektrotechniek Techniek

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Published Date

2003

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Research Group

Electronic Components, Technology and Materials

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