Thin-film MEMS encapsulation using low-stress PECVD silicon carbide

Conference Paper (2008)
Author(s)

V Rajaraman (TU Delft - Electronic Instrumentation)

L Pakula (TU Delft - Electronic Instrumentation)

HTM Pham (TU Delft - Old - EWI Sect. ECTM)

Pasqualina Maria Sarro (TU Delft - Electronic Components, Technology and Materials)

P. J. French (TU Delft - Electronic Instrumentation)

Research Group
Electronic Instrumentation
More Info
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Publication Year
2008
Research Group
Electronic Instrumentation
Pages (from-to)
491-494
ISBN (print)
ISBN 978-3-00-025217-4

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