Orientation dependent electron mobility behavior with downscaling of Fin-width in double and triple gate SOI FinFETS
Conference Paper
(2010)
Author(s)
M Poljak (External organisation)
V Jovanovic (TU Delft - Electronic Components, Technology and Materials)
T Suligoj (External organisation)
Research Group
Electronic Components, Technology and Materials
To reference this document use:
https://resolver.tudelft.nl/uuid:08398ed6-84c4-4fb6-a68e-6eb2ad4590fe
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Publication Year
2010
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-3
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