The effect of the silicon top layer of silicon implanted with oxygen on the uptake and release of deuterium
Journal Article
(1998)
Author(s)
L Zimmerman (External organisation)
JMM de Nijs (External organisation)
P. F.A. Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))
KT Westerduin (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - Section Defects in Materials)
Research Group
Old - sect Electronic Materials (NS/EM)
To reference this document use:
https://resolver.tudelft.nl/uuid:0aeb0150-f7f1-459d-b101-287455a5e7fa
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Publication Year
1998
Research Group
Old - sect Electronic Materials (NS/EM)
Volume number
73
Pages (from-to)
774-776
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