Bit line coupling memory tests for single cell fails in SRAMs
Conference Paper
(2010)
Author(s)
I.S. Irobi (TU Delft - Computer Engineering)
Z Al-Ars (TU Delft - Computer Engineering)
Said Hamdioui (TU Delft - Computer Engineering)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:0fcf89ed-9742-4b2b-8bb9-bce53f1b89c1
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Publication Year
2010
Research Group
Computer Engineering
Pages (from-to)
1-6
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