X-ray nanodiffraction on a single SiGe quantum dot inside a functioning field-effect transistor

N Hrauda (External organisation)

Jing Zhang (TU Delft - Electronic Components, Technology and Materials)

E Wintersberger (External organisation)

T Etzelstorfer (External organisation)

B Mandl (External organisation)

J Stangl (External organisation)

D Carbone (External organisation)

V Holy (External organisation)

V Jovanovic (TU Delft - Electronic Components, Technology and Materials)

C Biasotto (TU Delft - Electronic Components, Technology and Materials)

LK Nanver (TU Delft - Electronic Components, Technology and Materials)

J Moers (External organisation)

D Grutzmacher (External organisation)

G Baur (External organisation)