Positron annihilation as a tool for the study of defects in the MOS system
Journal Article
(1997)
Author(s)
JMM de Nijs (TU Delft - QN/Fysics of NanoElectronics)
M Clement (TU Delft - QN/Fysics of NanoElectronics)
H. Schut (TU Delft - Old - Section Defects in Materials)
A van Veen (TU Delft - Old - sect Radiation Physics Group (TN/RF))
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:19455865-d594-4009-9336-1b5529ce9753
More Info
expand_more
expand_more
Publication Year
1997
Research Group
QN/Fysics of NanoElectronics
Volume number
36
Pages (from-to)
35-42
No files available
Metadata only record. There are no files for this record.