Library
search
local_library
Repository
M
M Clement
View Pure Profile
Authored
7 records found
Positron annihilation as a tool for the study of defects in the MOS system
Journal article -
JMM de Nijs
,
M Clement
,
H. Schut
,
A van Veen
Positron beam technique for the study of defects at the Si/SiO2 interface of a polysillicon gated MOS system
Conference paper -
M Clement
,
JMM de Nijs
,
H. Schut
,
A van Veen
,
P Balk
Positrons in the MOS system
Doctoral thesis -
M Clement
Analysis of positron beam data by combined use of the shape and wing parameters
Journal article -
M Clement
,
JMM de Nijs
,
A van Veen
,
H. Schut
,
P Balk
Transport of positrons in an electrically biased MOS system
Journal article -
M Clement
,
JMM de Nijs
,
H. Schut
,
A van Veen
,
P Balk
Characterization of defects at the Si/SiO2 interface of a polysilicon-gated MOS system by monoenergetic positrons
Journal article -
M Clement
,
JMM de Nijs
,
H. Schut
,
A van Veen
Positron beam analysis of semiconductor materials using a two-detector Coppler broadeing coincidence system
Journal article -
AC Kruseman
,
H. Schut
,
A van Veen
,
P.E. Mijnarends
,
M Clement
,
JMM de Nijs