6 records found
1
Positrons in the MOS system
Positron annihilation as a tool for the study of defects in the MOS system
Positron beam technique for the study of defects at the Si/SiO2 interface of a polysillicon gated MOS system
Transport of positrons in an electrically biased MOS system
Characterization of defects at the Si/SiO2 interface of a polysilicon-gated MOS system by monoenergetic positrons
Analysis of positron beam data by combined use of the shape and wing parameters
