Reverse biasing and breakdown behavior of PureB diodes
Conference Paper
(2013)
Author(s)
L. Qi (TU Delft - Electronic Components, Technology and Materials)
KRC Mok (External organisation)
M Aminian (External organisation)
T.L.M. Scholtes (TU Delft - Electronic Components, Technology and Materials)
E. Charbon-Iwasaki-Charbon (TU Delft - Signal Processing Systems)
Lis Nanver (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/IWJT.2013.6644508
To reference this document use:
https://resolver.tudelft.nl/uuid:1a5ce167-f017-4a33-87ef-9088ab40e6d6
More Info
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Publication Year
2013
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
70-73
ISBN (print)
978-1-4799-0578-2
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