Reverse biasing and breakdown behavior of PureB diodes

Conference paper (2013)

Authors

L. Qi Electronic Components, Technology and Materials - EEMCS
KRC Mok External organisation
M Aminian External organisation
T.L.M. Scholtes Electronic Components, Technology and Materials - EEMCS
E. Charbon-Iwasaki-Charbon Signal Processing Systems - EEMCS
L.K. Nanver Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2013

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials