Stochastic analysis of deep-submicron CMOS process for reliable circuits designs
Journal Article
(2010)
Author(s)
A Zjajo (TU Delft - Signal Processing Systems)
Q Tang (TU Delft - Signal Processing Systems)
J Pineda de Gyvez (External organisation)
MRCM Berkelaar (TU Delft - Signal Processing Systems)
A Di Bucchianico (External organisation)
NP van der Meijs (TU Delft - Signal Processing Systems)
Research Group
Signal Processing Systems
DOI related publication
https://doi.org/10.1109/TCSI.2010.2055291
To reference this document use:
https://resolver.tudelft.nl/uuid:22d947bc-8d01-4b88-9e65-bea15affc4de
More Info
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Publication Year
2010
Language
English
Research Group
Signal Processing Systems
Issue number
1
Volume number
58
Pages (from-to)
164-175
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