Memory Test Optimization for Parasitic Bit Line Coupling in SRAMs
Poster
(2011)
Author(s)
I.S. Irobi (TU Delft - Computer Engineering)
Z Al-Ars (TU Delft - Computer Engineering)
Said Hamdioui (TU Delft - Computer Engineering)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:2475f3c9-4159-4c64-b771-b7d47554c74d
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Publication Year
2011
Language
English
Research Group
Computer Engineering
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