System NEP Verification of a Wideband THz Direct Detector in CMOS

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System NEP Verification of a Wideband THz Direct Detector in CMOS

Conference Paper (2020)

Author(s)

Sven Van Berkel (TU Delft - Tera-Hertz Sensing)

E.S. Malotaux (TU Delft - Electronics)

C.D. De Martino (TU Delft - Electronics)

Marco Spirito (TU Delft - Electronics)

Daniele Cavallo (TU Delft - Tera-Hertz Sensing)

A Neto (TU Delft - Tera-Hertz Sensing)

N Llombart (TU Delft - Tera-Hertz Sensing)

Research Group

Electronics

DOI related publication

https://doi.org/10.1109/IRMMW-THz46771.2020.9370624

To reference this document use:

https://resolver.tudelft.nl/uuid:2d54f2de-5e26-4df8-8535-0a492a382432

More Info

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Publication Year

2020

Language

English

Research Group

Electronics

Pages (from-to)

72

ISBN (electronic)

978-1-7281-6620-9

Abstract

The predicted Noise Equivalent Power (NEP) of a THz direct detector is validated by means of a noise- and a system responsivity measurement. The direct detector consists of a double leaky slot lens antenna that operates from 200 GHz to 600 GHz in combination with a differential pair of Schottky Barrier Diodes (SBDs). The model is derived from low-frequency measurements.

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