Characterization of tightly sampled, direct-detection THz imager integrated in 22 nm CMOS

M. Hoogelander (TU Delft - Electrical Engineering, Mathematics and Computer Science)

S. van Berkel

S. Malotaux (TU Delft - Electrical Engineering, Mathematics and Computer Science)

M. Alonso-DelPino (TU Delft - Electrical Engineering, Mathematics and Computer Science)

M. Spirito (TU Delft - Electrical Engineering, Mathematics and Computer Science)

A. Neto (TU Delft - Electrical Engineering, Mathematics and Computer Science)

D. Cavallo (TU Delft - Electrical Engineering, Mathematics and Computer Science)

N. Llombart (TU Delft - Electrical Engineering, Mathematics and Computer Science)