Characterization of tightly sampled, direct-detection THz imager integrated in 22 nm CMOS
M. Hoogelander (TU Delft - Tera-Hertz Sensing)
S. van Berkel
S. Malotaux (TU Delft - Electronics)
M. Alonso-DelPino (TU Delft - Tera-Hertz Sensing)
M. Spirito (TU Delft - Electronics)
A. Neto (TU Delft - Tera-Hertz Sensing)
D. Cavallo (TU Delft - Tera-Hertz Sensing)
N. Llombart (TU Delft - Tera-Hertz Sensing)
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