Design and characterization of passive RF structures on reduced-thicknness conductor-backed substrates
Conference Paper
(1999)
Author(s)
TK Ng (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
B Rejaei Salmassi (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
PN Pham (TU Delft - Electronic Components, Technology and Materials)
JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:346c8836-0872-40d7-9e8e-b632a1eca5b9
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Publication Year
1999
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
329-331
ISBN (print)
90-73461-18-9
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