Towards High-Fidelity Gates for the Nitrogen-Vacancy Center in Diamond

Conference Paper (2024)
Authors

Jiwon Yun (TU Delft - QID/Taminiau Lab, Kavli institute of nanoscience Delft, TU Delft - QuTech Advanced Research Centre)

H. P. Bartling (TU Delft - QID/Taminiau Lab, Kavli institute of nanoscience Delft, TU Delft - QuTech Advanced Research Centre)

K. N. Schymik (TU Delft - QID/Taminiau Lab, Kavli institute of nanoscience Delft, TU Delft - QuTech Advanced Research Centre)

Margriet van Riggelen (TU Delft - QID/Taminiau Lab, Kavli institute of nanoscience Delft, TU Delft - QuTech Advanced Research Centre)

Luc Enthoven (TU Delft - QuTech Advanced Research Centre, QCD/Sebastiano Lab, Kavli institute of nanoscience Delft)

Hendrik Benjamin Van Ommen (TU Delft - QuTech Advanced Research Centre, Kavli institute of nanoscience Delft, TU Delft - QID/Taminiau Lab)

M Babaie (TU Delft - Electronics, TU Delft - QuTech Advanced Research Centre)

F Sebastiano (TU Delft - Quantum Circuit Architectures and Technology, TU Delft - QuTech Advanced Research Centre)

TH Taminiau (TU Delft - QuTech Advanced Research Centre, Kavli institute of nanoscience Delft, TU Delft - Quantum Internet Division)

Research Group
QID/Taminiau Lab
To reference this document use:
https://doi.org/10.1364/QUANTUM.2024.QTh2A.5
More Info
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Publication Year
2024
Language
English
Research Group
QID/Taminiau Lab
ISBN (electronic)
978-1-55752-518-5
DOI:
https://doi.org/10.1364/QUANTUM.2024.QTh2A.5
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Abstract

We realize high-fidelity gates for the two-qubit system formed by NV center. Using gate set tomography, we report gate fidelities exceeding 99%, and analyze the origin of the errors.

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