Bias temperature instability analysis in SRAM decoder
Conference Paper
(2013)
Author(s)
M.S.K. Seyab (TU Delft - Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
H Kukner (External organisation)
P Raghavan (External organisation)
F Catthoor (External organisation)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:39ea54db-cc9d-4d57-832b-2cd4c025a7ce
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Publication Year
2013
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-1
ISBN (print)
978-1-4673-6377-8
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