Erratum to

Sub-gap defect density characterization of molybdenum oxide: An annealing study for solar cell applications (Nano Research, (2020), 13, 12, (3416-3424), 10.1007/s12274-020-3029-9)

Journal Article (2022)
Author(s)

Daniele Scirè (Università degli Studi di Palermo, TU Delft - Photovoltaic Materials and Devices)

P.A. Procel Moya (TU Delft - Photovoltaic Materials and Devices)

Antonino Gulino (University of Catania)

O. Isabella (TU Delft - Photovoltaic Materials and Devices)

M. Zeman (TU Delft - Electrical Sustainable Energy)

Isodiana Crupi (Università degli Studi di Palermo)

Research Group
Photovoltaic Materials and Devices
Copyright
© 2022 D. Scire, P.A. Procel Moya, Antonino Gulino, O. Isabella, M. Zeman, Isodiana Crupi
DOI related publication
https://doi.org/10.1007/s12274-022-4222-9
More Info
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Publication Year
2022
Language
English
Copyright
© 2022 D. Scire, P.A. Procel Moya, Antonino Gulino, O. Isabella, M. Zeman, Isodiana Crupi
Related content
Research Group
Photovoltaic Materials and Devices
Issue number
8
Volume number
15
Pages (from-to)
7752-7753
Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Abstract

Ref. [56] was unfortunately wrong, Instead of [56] Corless, R. M.; Gonnet, G. H.; Hare, D. E. G.; Jeffrey, D. J.; Knuth, D. E. On the Lambert W function. Adv. Comput. Math. 1996, 5, 329–359. It should be changed to Biswas, R. K.; Khan, P.; Mukherjee, S.; Mukhopadhyay, A. K.; Ghosh, J.; Muraleedharan, K. Study of short range structure of amorphous Silica from PDF using Ag radiation in laboratory XRD system, RAMAN and NEXAFS. J. Non. Cryst. Solids 2018, 488, 1–9. Some entries in Table 2 were unfortunately misprinted.

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