Processability and electrical characteristic of glass substrates for RF wafer-level chip-scale packages
Conference Paper
(2003)
Author(s)
A Poliakov (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
P Mendes (TU Delft - Electronic Components, Technology and Materials)
SM Sinaga (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
B. Rajaei Salmasi (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
JH Correia (External organisation)
JN Burghartz (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
Research Group
Old - EWI Ch. Integrated Sensing Devices
To reference this document use:
https://resolver.tudelft.nl/uuid:41523b33-7372-469f-89ee-4e44e682a4c1
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Publication Year
2003
Research Group
Old - EWI Ch. Integrated Sensing Devices
Pages (from-to)
875-880
ISBN (print)
0-7803-7430-4
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