Defect oriented testing of the strap problem under process variations in DRAMs
Conference Paper
(2008)
Author(s)
Z Al-Ars (TU Delft - Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
AJ van de Goor (TU Delft - Computer Engineering)
G Mueller (External organisation)
Research Group
Computer Engineering
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https://resolver.tudelft.nl/uuid:424e060c-f5b8-46a0-aceb-4eb7c07d10e1
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Publication Year
2008
Research Group
Computer Engineering
Pages (from-to)
1-10
ISBN (print)
978-1-4244-2403-0
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