Varying characteristics of bipolar transistors with emitter contact window width
Conference Paper
(2001)
Author(s)
J Fu (TU Delft - Electrical Engineering, Mathematics and Computer Science)
S Mijalkovic (TU Delft - Old - EWI Ch. Integrated Sensing Devices)
WJ Eysenga (TU Delft - Electrical Engineering, Mathematics and Computer Science)
HW van Zeijl (TU Delft - Electrical Engineering, Mathematics and Computer Science)
W Crans (TU Delft - Electrical Engineering, Mathematics and Computer Science)
Research Group
Electronic Components, Technology and Materials
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Publication Year
2001
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
Publisher
Springer
ISBN (print)
3-211-83708-6
Event
Simulation of Semiconductor Processes and Devices, S.l. (2001-09-05 - 2001-09-07), Wien-NewYork
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