Thermally activated flux motion and quantum creep in YBa2Cu3O7 and Y2Ba4Cu8O16 films
Hai hu Wen (Vrije Universiteit Amsterdam)
R. Griessen (Vrije Universiteit Amsterdam)
D.G. De Groot (Vrije Universiteit Amsterdam)
B. Dam (Vrije Universiteit Amsterdam)
J. Rector (Vrije Universiteit Amsterdam)
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Abstract
The dynamical relaxation rate Q dln js/dln(dB/dt) where js is the current induced in a superconductor when the external field is swept at a rate dB/dt, has been measured in YBa2Cu3O7 and Y2Ba4Cu8O16 films of 100 nm and 180 nm thickness as a function of magnetic field at temperatures between 2 K and Tc. The data show i) a non zero relaxation at low T due to quantum creep, ii) a plateau between 15 and ∼ 50 K and iii) a divergence when T approaches the irreversibility line. The data are analyzed within the collective pinning model. At low temperatures it is shown that both js and Q are influenced by quantum creep.
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