Investigation of hole mobility in ultrathin-body SOI MOSFETs on (110) surface: Effects of silicon thickness and body doping
Conference Paper
(2011)
Author(s)
M Poljak (External organisation)
V Jovanovic (TU Delft - Electronic Components, Technology and Materials)
T Suligoj (External organisation)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/SOI.2011.6081691
To reference this document use:
https://resolver.tudelft.nl/uuid:51379793-3a5d-44c5-ac9a-9672f8323476
More Info
expand_more
expand_more
Publication Year
2011
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
114-115
ISBN (print)
978-1-61284-760-3
No files available
Metadata only record. There are no files for this record.