Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis
Conference Paper
(2012)
Author(s)
M.S.K. Seyab (TU Delft - Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
H Kukner (External organisation)
P Raghavan (External organisation)
F Catthoor (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:532daf2a-d81c-4f88-b754-350cb3405a83
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Publication Year
2012
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-6
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