Detecting memory faults in the presence of bit line coupling in SRAM devices
Conference Paper
(2010)
Author(s)
I.S. Irobi (TU Delft - Computer Engineering)
Z Ars (TU Delft - Computer Engineering)
Said Hamdioui (TU Delft - Computer Engineering)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:5430cc6b-9e5c-40a8-acad-8e4b6ea4d3f1
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Publication Year
2010
Language
English
Research Group
Computer Engineering
Pages (from-to)
1-10
ISBN (print)
978-1-4244-7207-9
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