Prediction of crack growth in IC passivation layers
Journal Article
(2004)
Author(s)
Y He (TU Delft - Dynamics of Micro and Nano Systems)
MAJ van Gils (External organisation)
WD van Driel (External organisation)
GQ Zhang (External organisation)
RBR van Silfhout (External organisation)
Leo Ernst (TU Delft - Dynamics of Micro and Nano Systems)
Research Group
Dynamics of Micro and Nano Systems
To reference this document use:
https://resolver.tudelft.nl/uuid:56c15963-72b4-43ee-ab19-7f811333cf58
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Publication Year
2004
Research Group
Dynamics of Micro and Nano Systems
Volume number
44
Pages (from-to)
2003-2009
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