New insights into the nanostructure of innovative thin film solar cells gained by positron annihilation spectroscopy

Journal Article (2017)
Author(s)

Stephan Eijt (TU Delft - RST/Fundamental Aspects of Materials and Energy)

Wenqin Shi (TU Delft - RST/Fundamental Aspects of Materials and Energy)

A. Mannheim

Maik Butterling (TU Delft - RST/Fundamental Aspects of Materials and Energy)

Henk Schut (TU Delft - RST/Neutron and Photon Methods for Materials)

W Egger (Universität der Bundeswehr München)

M. Dickmann (Universität der Bundeswehr München)

C Hugenschmidt (Technische Universität München)

B. Shakeri (University of Maine)

R.W. Meulenberg (University of Maine)

V. Callewaert (Universiteit Antwerpen)

R Saniz (Universiteit Antwerpen)

B Partoens (Universiteit Antwerpen)

B Barbiellini (Northeastern University)

A Bansil (Northeastern University)

Jimmy Melskens (TU Delft - Photovoltaic Materials and Devices)

Miro Zeman (TU Delft - Electrical Sustainable Energy)

Arno Smets (TU Delft - Photovoltaic Materials and Devices)

M. Kulbak (Weizmann Institute of Science)

G. Hodes (Weizmann Institute of Science)

D. Cahen (Weizmann Institute of Science)

Ekkes Brück (TU Delft - RST/Fundamental Aspects of Materials and Energy)

Research Group
RST/Fundamental Aspects of Materials and Energy
DOI related publication
https://doi.org/10.1088/1742-6596/791/1/012021
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Publication Year
2017
Language
English
Research Group
RST/Fundamental Aspects of Materials and Energy
Volume number
791
Article number
012021
Event
14th International Workshop on Slow Positron Beam Techniques & Applications (2016-05-22 - 2016-05-27), Matsue, Japan
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Abstract

Recent studies showed that positron annihilation methods can provide key insights into the nanostructure and electronic structure of thin film solar cells. In this study, positron annihilation lifetime spectroscopy (PALS) is applied to investigate CdSe quantum dot (QD) light absorbing layers, providing evidence of positron trapping at the surfaces of the QDs. This enables one to monitor their surface composition and electronic structure. Further, 2D-Angular Correlation of Annihilation Radiation (2D-ACAR) is used to investigate the nanostructure of divacancies in photovoltaic-high-quality a-Si:H films. The collected momentum distributions were converted by Fourier transformation to the direct space representation of the electron-positron autocorrelation function. The evolution of the size of the divacancies as a function of hydrogen dilution during deposition of a-Si:H thin films was examined. Finally, we present a first positron Doppler Broadening of Annihilation Radiation (DBAR) study of the emerging class of highly efficient thin film solar cells based on perovskites.