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New insights into the nanostructure of innovative thin film solar cells gained by positron annihilation spectroscopy

Journal Article (2017)
Author(s)

Stephan Eijt (TU Delft - Applied Sciences)

Wenqin Shi (TU Delft - Applied Sciences)

A. Mannheim

Maik Butterling (TU Delft - Applied Sciences)

Henk Schut (TU Delft - Applied Sciences)

W Egger (Universität der Bundeswehr München)

M. Dickmann (Universität der Bundeswehr München)

C Hugenschmidt (Technische Universität München)

B. Shakeri (University of Maine)

R.W. Meulenberg (University of Maine)

V. Callewaert (Universiteit Antwerpen)

R Saniz (Universiteit Antwerpen)

B Partoens (Universiteit Antwerpen)

B Barbiellini (Northeastern University)

A Bansil (Northeastern University)

Jimmy Melskens (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Miro Zeman (TU Delft - Electrical Engineering, Mathematics and Computer Science)

Arno Smets (TU Delft - Electrical Engineering, Mathematics and Computer Science)

M. Kulbak (Weizmann Institute of Science)

G. Hodes (Weizmann Institute of Science)

D. Cahen (Weizmann Institute of Science)

Ekkes Brück (TU Delft - Applied Sciences)

Research Group
RST/Fundamental Aspects of Materials and Energy
DOI related publication
https://doi.org/10.1088/1742-6596/791/1/012021 Final published version
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Publication Year
2017
Language
English
Research Group
RST/Fundamental Aspects of Materials and Energy
Volume number
791
Article number
012021
Event
14th International Workshop on Slow Positron Beam Techniques & Applications (2016-05-22 - 2016-05-27), Matsue, Japan
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Abstract

Recent studies showed that positron annihilation methods can provide key insights into the nanostructure and electronic structure of thin film solar cells. In this study, positron annihilation lifetime spectroscopy (PALS) is applied to investigate CdSe quantum dot (QD) light absorbing layers, providing evidence of positron trapping at the surfaces of the QDs. This enables one to monitor their surface composition and electronic structure. Further, 2D-Angular Correlation of Annihilation Radiation (2D-ACAR) is used to investigate the nanostructure of divacancies in photovoltaic-high-quality a-Si:H films. The collected momentum distributions were converted by Fourier transformation to the direct space representation of the electron-positron autocorrelation function. The evolution of the size of the divacancies as a function of hydrogen dilution during deposition of a-Si:H thin films was examined. Finally, we present a first positron Doppler Broadening of Annihilation Radiation (DBAR) study of the emerging class of highly efficient thin film solar cells based on perovskites.