Electromigration and diffusion in short Al-Ni-Cr lines

Conference paper (1998)

Authors

LC Jacobs External organisation
A.H. Verbruggen QN/Fysics of NanoElectronics
AJ Kalkman QN/Fysics of NanoElectronics
S Radelaar OLD Metals Processing, Microstructures and Properties
Research Group
QN/Fysics of NanoElectronics
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Published Date

1998

Language

Undefined/Unknown

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Research Group

QN/Fysics of NanoElectronics