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LJ
LC Jacobs
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Authored
4 records found
Resistance Changes Induced by the Formation of a Single Void/Hillock During Electromigration
Conference paper -
A.H. Verbruggen
,
MJC van de Homberg
,
LC Jacobs
,
AJ Kalkman
,
JR Kraayeveld
,
S Radelaar
Engineering challenges in the large scale purification of HSA using SMB technology
Conference paper -
L.A.M. van der Wielen
,
J Houwing
,
LC Jacobs
,
HA Billiet
,
J.T. Pronk
Electromigration in short Al lines studied by high-resolution resistance measurement
Conference paper -
A.H. Verbruggen
,
MJC van de Homberg
,
LC Jacobs
,
AJ Kalkman
,
JR Kraayeveld
,
S Radelaar
Electromigration and diffusion in short Al-Ni-Cr lines
Conference paper -
LC Jacobs
,
A.H. Verbruggen
,
AJ Kalkman
,
S Radelaar