11 records found
1
l/f noise in mono- and polycrystalline aluminium
Resistance Changes Induced by the Formation of a Single Void/Hillock During Electromigration
Microstructural and electrical properties of resolidified submicron Al lines.
Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines
Fabricaton of submicron single-crystalline and bamboo Al lines by recrystallization
Electromigration in short Al lines studied by high-resolution resistance measurement
1/f noise and microsructure in thin aluminium lines
Curved crystal lattice in resolidified submicron Al lines
Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines
Current dependence of reversible electromigration induced resistance changes in short Al lines and interpretation of irreversible effects
Single-crystalline and bamboo Al lines fabricated by graphoepitaxy
