Mv

MJC van de Homberg

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11 records found

Resistance Changes Induced by the Formation of a Single Void/Hillock During Electromigration

Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

Microstructural and electrical properties of resolidified submicron Al lines.
Doctoral thesis - MJC van de Homberg

Single-crystalline and bamboo Al lines fabricated by graphoepitaxy

Fabricaton of submicron single-crystalline and bamboo Al lines by recrystallization

1/f noise and microsructure in thin aluminium lines

Electromigration in short Al lines studied by high-resolution resistance measurement

Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines

Curved crystal lattice in resolidified submicron Al lines

Current dependence of reversible electromigration induced resistance changes in short Al lines and interpretation of irreversible effects

l/f noise in mono- and polycrystalline aluminium