1/f noise and microsructure in thin aluminium lines
Conference Paper
(1997)
Author(s)
E Ochs (External organisation)
MJC van de Homberg (TU Delft - QN/Fysics of NanoElectronics)
Paul Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))
K Armbruster (External organisation)
A Seeger (External organisation)
H Stoll (External organisation)
AH Verbruggen (TU Delft - QN/Fysics of NanoElectronics)
Research Group
QN/Fysics of NanoElectronics
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https://resolver.tudelft.nl/uuid:c844d950-7552-4e50-908a-558e40b60df8
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Publication Year
1997
Research Group
QN/Fysics of NanoElectronics
Pages (from-to)
415-418
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