Current dependence of reversible electromigration induced resistance changes in short Al lines and interpretation of irreversible effects

Conference paper (1996)

Authors

A.H. Verbruggen QN/Fysics of NanoElectronics
MJC van de Homberg QN/Fysics of NanoElectronics
AJ Kalkman QN/Fysics of NanoElectronics
JR Kraayeveld External organisation
AWJ Willemsen External organisation
S Radelaar OLD Metals Processing, Microstructures and Properties
Research Group
QN/Fysics of NanoElectronics
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Published Date

1996

Language

Undefined/Unknown

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Research Group

QN/Fysics of NanoElectronics