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JR Kraayeveld
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Authored
4 records found
Resistance Changes Induced by the Formation of a Single Void/Hillock During Electromigration
Conference paper -
A.H. Verbruggen
,
MJC van de Homberg
,
LC Jacobs
,
AJ Kalkman
,
JR Kraayeveld
,
S Radelaar
Electromigration in short Al lines studied by high-resolution resistance measurement
Conference paper -
A.H. Verbruggen
,
MJC van de Homberg
,
LC Jacobs
,
AJ Kalkman
,
JR Kraayeveld
,
S Radelaar
Indications for band-structure effects in 2-dimensional lateral supperlattices
Journal article -
KMH Lenssen
,
MEJ Boonman
,
JR Kraayeveld
,
CT Foxon
Current dependence of reversible electromigration induced resistance changes in short Al lines and interpretation of irreversible effects
Conference paper -
A.H. Verbruggen
,
MJC van de Homberg
,
AJ Kalkman
,
JR Kraayeveld
,
AWJ Willemsen
,
S Radelaar