Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

Conference paper (1998)

Authors

MJC van de Homberg QN/Fysics of NanoElectronics
P.F.A. Alkemade Old - sect Electronic Materials (NS/EM)
A.H. Verbruggen QN/Fysics of NanoElectronics
AG Dirks External organisation
E Ochs External organisation
S Radelaar OLD Metals Processing, Microstructures and Properties
Research Group
QN/Fysics of NanoElectronics
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Published Date

1998

Language

Undefined/Unknown

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Research Group

QN/Fysics of NanoElectronics