Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines

MJC van de Homberg (TU Delft - QN/Fysics of NanoElectronics)

P.F.A. Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))

AH Verbruggen (TU Delft - QN/Fysics of NanoElectronics)

AG Dirks (External organisation)

E Ochs (External organisation)

S Radelaar (TU Delft - OLD Metals Processing, Microstructures and Properties)