Library
search
local_library
Repository
AD
AG Dirks
View Pure Profile
Authored
5 records found
Electromigration and l/f noise in single-crystalline, bamboo and polycrystalline Al lines
Conference paper -
MJC van de Homberg
,
P.F.A. Alkemade
,
A.H. Verbruggen
,
AG Dirks
,
E Ochs
,
S Radelaar
Fabricaton of submicron single-crystalline and bamboo Al lines by recrystallization
Journal article -
MJC van de Homberg
,
A.H. Verbruggen
,
P.F.A. Alkemade
,
AG Dirks
,
JL Hurd
,
S Radelaar
Report on electromigration- and stress migration properties of AlSi VPd alloys
Report -
JP Lokker
,
AJ Kalkman
,
A.H. Verbruggen
,
G.C.A.M. Janssen
,
S Kordic
,
RA Augur
,
AG Dirks
,
R. Wolters
Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines
Conference paper -
MJC van de Homberg
,
P.F.A. Alkemade
,
A.H. Verbruggen
,
AG Dirks
,
E Ochs
,
S Radelaar
Curved crystal lattice in resolidified submicron Al lines
Journal article -
MJC van de Homberg
,
P.F.A. Alkemade
,
S Radelaar
,
JL Hurd
,
AG Dirks