Report on electromigration- and stress migration properties of AlSi VPd alloys
Report
(1996)
Author(s)
JP Lokker (TU Delft - QN/Fysics of NanoElectronics)
AJ Kalkman (TU Delft - QN/Fysics of NanoElectronics)
A.H. Verbruggen (TU Delft - QN/Fysics of NanoElectronics)
GCAM Janssen (TU Delft - OLD Metals Processing, Microstructures and Properties)
S Kordic (External organisation)
RA Augur (External organisation)
AG Dirks (External organisation)
RAM Wolters (External organisation)
Research Group
QN/Fysics of NanoElectronics
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Publication Year
1996
Research Group
QN/Fysics of NanoElectronics
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