Electromigration and 1/f noise in single-crystalline, bamboo and polycrystalline Al lines
Conference Paper
(1997)
Author(s)
MJC van de Homberg (TU Delft - QN/Fysics of NanoElectronics)
P.F.A. Alkemade (TU Delft - Old - sect Electronic Materials (NS/EM))
AH Verbruggen (TU Delft - QN/Fysics of NanoElectronics)
AG Dirks (External organisation)
E Ochs (External organisation)
S Radelaar (TU Delft - OLD Metals Processing, Microstructures and Properties)
Research Group
QN/Fysics of NanoElectronics
To reference this document use:
https://resolver.tudelft.nl/uuid:ed03e716-f502-4917-a50a-90db2738c25a
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Publication Year
1997
Research Group
QN/Fysics of NanoElectronics
Pages (from-to)
211-216
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