An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components
Conference Paper
(2015)
Author(s)
M. Yazdan Mehr (TU Delft - Electronic Components, Technology and Materials)
A. Bahrami (External organisation)
H. Fischer (External organisation)
Sander Gielen (External organisation)
R Corbeij (External organisation)
Willem van Driel (TU Delft - Electronic Components, Technology and Materials)
G. Zhang (TU Delft - Electronic Components, Technology and Materials)
Research Group
Electronic Components, Technology and Materials
DOI related publication
https://doi.org/10.1109/EuroSimE.2015.7103124
To reference this document use:
https://resolver.tudelft.nl/uuid:6ab20585-d080-4fdb-b046-22b7daa60c3c
More Info
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Publication Year
2015
Language
English
Research Group
Electronic Components, Technology and Materials
Pages (from-to)
1-4
ISBN (print)
978-1-4799-9949-1
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