An overview of scanning acoustic microscope, a reliable method for non-destructive failure analysis of microelectronic components

Conference paper (2015)

Authors

M. Yazdan Mehr Electronic Components, Technology and Materials - EEMCS
Abbas Bahrami External organisation
H Fischer External organisation
S Gielen External organisation
R. Corbeij External organisation
W.D. van Driel Electronic Components, Technology and Materials - EEMCS
Kouchi Zhang Electronic Components, Technology and Materials - EEMCS
Research Group
Electronic Components, Technology and Materials (EEMCS) (TU Delft)
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Published Date

2015

Language

English

Reuse Rights

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Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Microelectronics

Research Group

Electronic Components, Technology and Materials