Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection
A. Sakic (TU Delft - Electronic Components, Technology and Materials)
L.K. Nanver (TU Delft - Electronic Components, Technology and Materials)
G van Veen (External organisation)
K Kooijman (External organisation)
P. Vogelsang (External organisation)
T.L.M. Scholtes (TU Delft - Electronic Components, Technology and Materials)
Wiebe de Boer (TU Delft - Electronic Components, Technology and Materials, TU Delft - Old - EWI Sect. ECTM)
W.H.A. Wien (TU Delft - Electronic Components, Technology and Materials)
S. Milosavljevic (TU Delft - Electronic Components, Technology and Materials)
C.T.H. Heerkens (TU Delft - ImPhys/Charged Particle Optics)
T Knezevic (External organisation)
I Spee (External organisation)
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