Detecting faults in peripheral circuits and an evaluation of SRAM tests
Conference Paper
(2004)
Author(s)
AJ van de Goor (TU Delft - Computer Engineering)
S Hamdioui (TU Delft - Computer Engineering)
R Wadsworth (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:6e53f8f5-ba50-4bbd-8369-3f9caa7a0d3c
More Info
expand_more
expand_more
Publication Year
2004
Research Group
Computer Engineering
Pages (from-to)
114-123
ISBN (print)
0-7803-8581-0
No files available
Metadata only record. There are no files for this record.