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R Wadsworth

Conference paper (3)

Journal article (1)

4 records found

1

Impact of stresses on the fault coverage of memory tests

Conference paper (2005) - S. Hamdioui (author) , Z. Al-Ars (author) , AJ van de Goor (author) , R Wadsworth (author)

Detecting faults in peripheral circuits and an evaluation of SRAM tests

Conference paper (2004) - AJ van de Goor (author) , S. Hamdioui (author) , R Wadsworth (author)

Memory fault modeling trends: a case study

Journal article (2004) - S. Hamdioui (author) , R Wadsworth (author) , J. Delos Reyes (author)

Importance of dynamic faults for new SRAM technologies

Conference paper (2003) - S. Hamdioui (author) , R Wadsworth (author) , JD Reyes (author) , AJ van de Goor (author)