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R Wadsworth
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Authored
4 records found
Detecting faults in peripheral circuits and an evaluation of SRAM tests
Conference paper -
AJ van de Goor
,
S. Hamdioui
,
R Wadsworth
Importance of dynamic faults for new SRAM technologies
Conference paper -
S. Hamdioui
,
R Wadsworth
,
JD Reyes
,
AJ van de Goor
Memory fault modeling trends: a case study
Journal article -
S. Hamdioui
,
R Wadsworth
,
J delos Reyes
Impact of stresses on the fault coverage of memory tests
Conference paper -
S. Hamdioui
,
Z. Al-Ars
,
AJ van de Goor
,
R Wadsworth