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J delos Reyes
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3 records found
Memory test experiment: industrial results and data
Journal article -
S. Hamdioui
,
AJ van de Goor
,
J delos Reyes
,
M Rodgers
Comparison of static and dynamic faults in 65nm memory technology
Conference paper -
S. Hamdioui
,
Z. Al-Ars
,
G. Gaydadjiev
,
J delos Reyes
Memory fault modeling trends: a case study
Journal article -
S. Hamdioui
,
R Wadsworth
,
J delos Reyes