10 records found
1
Memory test experiment: industrial results and data
Linked faults in random access memories: concept fault models, test algorithms, and industrial results
Detecting intra-word faults in word-oriented memories
Dynamic faults in random-access-memories: concept, fault models and tests
March SL: a test for all static linked memory faults
DPM Reduction on dual-port caches
March SS: A test for all static simple RAM faults
Impact of spot defects on fault modeling and tests in dual-port memories
Detecting unique faults in multi-port SRAMs
Realistic fault models and test procedure for multi-port SRAMs
