Linked faults in random access memories: concept fault models, test algorithms, and industrial results

Journal article (2004)

Authors

S. Hamdioui Computer Engineering - EEMCS
Z. Al-Ars Computer Engineering - EEMCS
AJ van de Goor Computer Engineering - EEMCS
M Rodgers External organisation
Research Group
Computer Engineering (EEMCS) (TU Delft)
More Info
expand_more

Published Date

2004

Language

Undefined/Unknown

Reuse Rights

Other than for strictly personal use, it is not permitted to download, forward or distribute the text or part of it, without the consent of the author(s) and/or copyright holder(s), unless the work is under an open content license such as Creative Commons.

Faculty

Electrical Engineering, Mathematics and Computer Science

Department

Quantum & Computer Engineering

Research Group

Computer Engineering