Linked faults in random access memories: concept fault models, test algorithms, and industrial results
Journal Article
(2004)
Author(s)
Said Hamdioui (TU Delft - Computer Engineering)
Z Al-Ars (TU Delft - Computer Engineering)
AJ van de Goor (TU Delft - Computer Engineering)
M Rodgers (External organisation)
Research Group
Computer Engineering
To reference this document use:
https://resolver.tudelft.nl/uuid:0e67174a-af6d-429d-b4ef-844ce7644cd4
More Info
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Publication Year
2004
Research Group
Computer Engineering
Issue number
5
Volume number
23
Pages (from-to)
737-757
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